FOLI10-RE FT-IR Emission Spectrometer

Product Introduction

Infrared emission spectroscopy is a direct and non-destructive method for obtaining spectral information of materials. It is an effective complement to infrared transmission, infrared reflection, attenuated total reflection (ATR), diffuse reflection and other measurement methods. Since the material itself is the source of infrared emission, the application fields of emission spectroscopy are relatively wide, such as the surface of substances that are not suitable for transmission measurement, strongly corrosive and non-transparent samples, spectral characteristics of emission sources, large-volume objects, distant targets, spectral characteristics of ultra-high temperature samples, and emission measurement of plasmas, etc.

The principle of infrared emission spectroscopy is based on Kirchhoff's Law. According to this law, when any substance is at a temperature above absolute zero, the atoms and molecules within it are thermally excited to higher energy levels and release energy by emission when returning to the ground state. Moreover, under thermal equilibrium conditions, the ratio of the emission energy to the absorption rate of a substance is solely dependent on the substance's temperature and the wavelength of the emission. That is, in thermal equilibrium, the energy emitted by a substance must be equal to the energy it absorbs.

Features

FOLI10-RE is an independent Fourier Transform Infrared Emission Spectrometer independently designed by Fluorescence Optics. This spectrometer integrates a dedicated emission platform, allowing the installation of various emission accessories and reference blackbodies to meet the characterization requirements of different materials at different temperatures. The main unit of the spectrometer is equipped with dual detector positions, facilitating the user's switching between multiple detectors at any time. The flexible optical path

design enables users to choose between focused and parallel optical paths to suit different samples. Additionally, the internal optical components of FOLI 10-RE can be replaced to extend the measurement spectral range to the near-infrared band, meeting the requirements for near-infrared source emission measurement.

The measurement methods and precautions for emission spectroscopy vary depending on the form of the sample. For thin film samples, they can be loaded onto a metal substrate for measurement to reduce the radiation from the substrate. The thickness of the prepared sample should not be too large or the gas concentration should not be too high to prevent spectral distortion caused by selfabsorption of the sample. If the background radiation is strong, the emission intensity of the background needs to be deducted when calculating the sample's emissivity to obtain accurate results. If the sample releases gas during the measurement process, users need to consider adding a purge to the emission device to reduce the influence of the gas on the spectrum.

Application

• Study the emission profile characteristics of the material
  
• Calculate the firing rate of the material
  
• The emission spectrum of mugwort column combustion
  
• Emission spectra of the ceramic sheet at different temperatures
  
• Testing of various physical therapy instruments in medical devices
  
• (Near) infrared light source test
  
• Spectral testing of ultra-high temperature samples
  
• Emission measurements of the plasma
  
• Emission research of human body acupoints
  
• Emission measurement of glass and building materials
  
• Emission measurement of solar energy collector tubes
  
• Emission measurement of various fabrics